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Comparison study of physical vapor-deposited and chemical vapor-deposited titanium nitride thin films using X-ray photoelectron spectroscopy
Comparison study of physical vapor-deposited and chemical vapor-deposited titanium nitride thin films using X-ray photoelectron spectroscopy
Comparison study of physical vapor-deposited and chemical vapor-deposited titanium nitride thin films using X-ray photoelectron spectroscopy
Zhao, J. (Autor:in) / Garza, E. G. (Autor:in) / Lam, K. (Autor:in) / Jones, C. M. (Autor:in)
APPLIED SURFACE SCIENCE ; 158 ; 246-251
01.01.2000
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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