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Dependence of contact resistivity on impurity concentration in Co/Si systems
Dependence of contact resistivity on impurity concentration in Co/Si systems
Dependence of contact resistivity on impurity concentration in Co/Si systems
Nakatsuka, O. (Autor:in) / Ashizawa, T. (Autor:in) / Nakai, K. (Autor:in) / Tobioka, A. (Autor:in) / Sakai, A. (Autor:in) / Zaima, S. (Autor:in) / Yasuda, Y. (Autor:in)
APPLIED SURFACE SCIENCE ; 159-160 ; 149-153
01.01.2000
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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