Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Dependence of contact resistivity on impurity concentration in Co/Si systems

    New search for: Nakatsuka, O.
    New search for: Ashizawa, T.
    New search for: Nakai, K.
    New search for: Tobioka, A.
    New search for: Sakai, A.
    New search for: Zaima, S.
    New search for: Yasuda, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Dependence of contact resistivity on impurity concentration in Co/Si systems

    New search for: Nakatsuka, O.
    New search for: Ashizawa, T.
    New search for: Nakai, K.
    New search for: Tobioka, A.
    New search for: Sakai, A.
    New search for: Zaima, S.
    New search for: Yasuda, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Dependence of contact resistivity on impurity concentration in Co/Si systems

    New search for: Nakatsuka, O.
    New search for: Ashizawa, T.
    New search for: Nakai, K.
    New search for: Tobioka, A.
    New search for: Sakai, A.
    New search for: Zaima, S.
    New search for: Yasuda, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Dependence of contact resistivity on impurity concentration in Co/Si systems

    Contributors:

    Nakatsuka, O. (author) / Ashizawa, T. (author) / Nakai, K. (author) / Tobioka, A. (author) / Sakai, A. (author) / Zaima, S. (author) / Yasuda, Y. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 159-160 ; 149-153

    Publication date:

    2000-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Contact resistivity between tungsten and impurity (P and B)-doped Si1-x-yGexCy epitaxial layer

    Noh, J. / Sakuraba, M. / Murota, J. et al. | British Library Online Contents | 2003

    Impurity Concentration Dependence of Recrystallization Process of Phosphorus Implanted 4H-SiC(11-20)

    Satoh, M. / Suzuki, T. | British Library Online Contents | 2006

    Temperature dependence of electrical resistivity of GRPs

    Konobievskii, I.D. | Engineering Index Backfile | 1966

    Resistivity and chloride diffusion coefficient of cement-based materials characterized by non-contact electrical resistivity method and resistivity model

    Wang, Yuncheng / Li, Yang / Wang, Fengjuan et al. | Elsevier | 2024

    Resistivity and chloride diffusion coefficient of cement-based materials characterized by non-contact electrical resistivity method and resistivity model

    Wang, Yuncheng / Li, Yang / Wang, Fengjuan et al. | Elsevier | 2024

    Back to top