Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Improved Probes for Scanning Near-Field Optical Microscopy
Improved Probes for Scanning Near-Field Optical Microscopy
Improved Probes for Scanning Near-Field Optical Microscopy
Suh, Y. D. (Autor:in) / Zenobi, R. (Autor:in)
ADVANCED MATERIALS -DEERFIELD BEACH- ; 12 ; 1139-1142
01.01.2000
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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