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Resolution and Contrast Generation in Scanning Near Field Optical Microscopy
Abstract In scanning near field optical microscopy (SNOM), an antenna of subwavelength size is scanned accross the object in close proximity. The modulated light emission due to near field interactions with the object is recorded for image formation. With 50 — 100 nm apertures in a metal film or protrusions serving as antennas a resolution of 30 — 100 nm — limited by the antenna size — is demonstrated. Phase contrast depending on electric excitation and contrast enhancement depending on local plasmon excitation of the antenna are demonstrated in two types of reflection mode SNOM, one of which — scanning optical tunneling microscopy — is closely analogous to STM.
Resolution and Contrast Generation in Scanning Near Field Optical Microscopy
Abstract In scanning near field optical microscopy (SNOM), an antenna of subwavelength size is scanned accross the object in close proximity. The modulated light emission due to near field interactions with the object is recorded for image formation. With 50 — 100 nm apertures in a metal film or protrusions serving as antennas a resolution of 30 — 100 nm — limited by the antenna size — is demonstrated. Phase contrast depending on electric excitation and contrast enhancement depending on local plasmon excitation of the antenna are demonstrated in two types of reflection mode SNOM, one of which — scanning optical tunneling microscopy — is closely analogous to STM.
Resolution and Contrast Generation in Scanning Near Field Optical Microscopy
Fischer, U. Ch. (Autor:in)
01.01.1990
22 pages
Aufsatz/Kapitel (Buch)
Elektronische Ressource
Englisch
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