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Influence of intrinsic stresses on crystallographic defects distribution in Cz-Si wafers
Influence of intrinsic stresses on crystallographic defects distribution in Cz-Si wafers
Influence of intrinsic stresses on crystallographic defects distribution in Cz-Si wafers
Piotrowski, T. (Autor:in) / Jung, W. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- A ; 288 ; 200 - 204
01.01.2000
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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