Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Surface morphology and removal rates for dry- and wet-etched novel resonator materials
Surface morphology and removal rates for dry- and wet-etched novel resonator materials
Surface morphology and removal rates for dry- and wet-etched novel resonator materials
Hays, D. C. (Autor:in) / Leerungnawarat, P. (Autor:in) / Pearton, S. J. (Autor:in) / Archibald, G. (Autor:in) / Smythe, R. C. (Autor:in)
APPLIED SURFACE SCIENCE ; 165 ; 135-140
01.01.2000
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Surface morphology and removal rates for dry- and wet-etched novel resonator materials
British Library Online Contents | 2000
|4H-SiC Surface Morphology Etched Using ClF~3 Gas
British Library Online Contents | 2010
|Surface morphology of polycrystalline diamond films etched by Ar^+ beam bombardment
British Library Online Contents | 1996
|Fine-scale morphology of ultraviolet-ozone etched polyethylene
British Library Online Contents | 1996
|Identification of SiC polytypes by etched Si-face morphology
British Library Online Contents | 2009
|