SIMS quantification of very low hydrogen contents

Rhede, D. / Wiedenbeck, M. | British Library Online Contents | 2006

Quantification in dynamic SIMS: Current status and future needs

Stevie, F. A. / Griffis, D. P. | British Library Online Contents | 2008

Quantification of SiGe layer composition using MCs+ and MCs2+ secondary ions in ToF-SIMS and magnetic SIMS

Marseilhan, D. / Barnes, J. P. / Fillot, F. et al. | British Library Online Contents | 2008

SIMS quantification of matrix and impurity species in AlxGa1-xN

Gu, C. J. / Stevie, F. A. / Hitzman, C. J. et al. | British Library Online Contents | 2006

SIMS quantification of low concentration of nitrogen doped in silicon crystals

Fujiyama, N. / Karen, A. / Sams, D. B. et al. | British Library Online Contents | 2003