Measurements and analysis of surface potential change during wear of single-crystal silicon (100) at ultralow loads using Kelvin probe microscopy

Bhushan, B. / Goldade, A. V. | British Library Online Contents | 2000

Measurements of electric potential in a laser diode by Kelvin Probe Force Microscopy

Leveque, G. / Girard, P. / Skouri, E. et al. | British Library Online Contents | 2000

Surface Potential Mapping of SAM-Functionalized Organic Semiconductors by Kelvin Probe Force Microscopy

Ellison, D. J. / Lee, B. / Podzorov, V. et al. | British Library Online Contents | 2011

Kelvin Probe Force Microscopy of Molecular Surfaces

Fujihira, M. | British Library Online Contents | 1999

Lateral resolution in scanning Kelvin probe microscopy

Wicinski, Mariusz / Burgstaller, Wolfgang / Hassel, Achim Walter | British Library Online Contents | 2016