Surface potential mapping of biased pn junction with kelvin probe force microscopy: application to cross-section devices

Doukkali, A. / Ledain, S. / Guasch, C. et al. | British Library Online Contents | 2004

Kelvin Probe Force Microscopy of Molecular Surfaces

Fujihira, M. | British Library Online Contents | 1999

Electronic Characterization of Organic Thin Films by Kelvin Probe Force Microscopy

Palermo, V. / Palma, M. / Samori, P. | British Library Online Contents | 2006

Transit Phenomena in Organic Field-Effect Transistors Through Kelvin-Probe Force Microscopy

Melzer, C. / Siol, C. / von Seggern, H. | British Library Online Contents | 2013

Kelvin probe force microscopy on III-V semiconductors: the effect of surface defects on the local work function

Glatzel, T. / Sadewasser, S. / Shikler, R. et al. | British Library Online Contents | 2003