Kelvin probe microscopy measurements of surface potential change under wear at low loads

Bhushan, B. / Goldade, A. V. | British Library Online Contents | 2000

Measurements of electric potential in a laser diode by Kelvin Probe Force Microscopy

Leveque, G. / Girard, P. / Skouri, E. et al. | British Library Online Contents | 2000

Material removal mechanisms of single-crystal silicon on nanoscale and at ultralow loads

Zhao, X. / Bhushan, B. | British Library Online Contents | 1998

Surface Potential Mapping of SAM-Functionalized Organic Semiconductors by Kelvin Probe Force Microscopy

Ellison, D. J. / Lee, B. / Podzorov, V. et al. | British Library Online Contents | 2011

Scanning Kelvin probe and surface photovoltage analysis of multicrystalline silicon

Castaldini, A. / Cavalcoli, D. / Cavallini, A. et al. | British Library Online Contents | 2002