Electrical activity of extended defects and gettering of metallic impurities in silicon

Kusanagi, S. / Sekiguchi, T. / Shen, B. et al. | British Library Online Contents | 1995

Raman Image Study of Defects in Ion-implanted and Post-Annealed Silicon

Mizoguchi, K. / Nakashima, S. / Harima, H. et al. | British Library Online Contents | 1995

Far-Action Radiation Defects and Gettering Effects in 4H-SiC Implanted with Al Ions

Kalinina, E.V. / Zamoryanskaya, M.V. / Kolesnikova, E.V. et al. | British Library Online Contents | 2009

Structural Defects Formed in Al-Implanted and Annealed 4H-SiC

Jones, K. A. / Zheleva, T. S. / Kulkarni, V. N. et al. | British Library Online Contents | 2004

Nitrogen impurity gettering in oxide dispersion ductilized chromium

Brady, M. P. / Anderson, I. M. / Weaver, M. L. et al. | British Library Online Contents | 2003