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Real-time x-ray scattering study of growth behavior of sputter-deposited LaNiO~3 thin films on Si substrates
Real-time x-ray scattering study of growth behavior of sputter-deposited LaNiO~3 thin films on Si substrates
Real-time x-ray scattering study of growth behavior of sputter-deposited LaNiO~3 thin films on Si substrates
Lee, H.-Y. (Autor:in) / Liang, K. S. (Autor:in) / Lee, C.-H. (Autor:in) / Wu, T.-B. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 15 ; 2606-2611
01.01.2000
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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