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Structural characterization of sputter-deposited LaNiO~3 thin films on Si substrate by x-ray reflectivity and diffraction
Structural characterization of sputter-deposited LaNiO~3 thin films on Si substrate by x-ray reflectivity and diffraction
Structural characterization of sputter-deposited LaNiO~3 thin films on Si substrate by x-ray reflectivity and diffraction
Lee, H.-Y. (Autor:in) / Wu, T.-B. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 12 ; 3165-3173
01.01.1997
9 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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