Real-time x-ray scattering study of growth behavior of sputter-deposited LaNiO~3 thin films on Si substrates: Fid-Bau Portal

Real-time x-ray scattering study of growth behavior of sputter-deposited LaNiO~3 thin films on Si substrates

Lee, H.-Y. / Liang, K. S. / Lee, C.-H. / Wu, T.-B.

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Real-time x-ray scattering study of growth behavior of sputter-deposited LaNiO~3 thin films on Si substrates

Lee, H.-Y. / Liang, K. S. / Lee, C.-H. / Wu, T.-B.

Real-time x-ray scattering study of growth behavior of sputter-deposited LaNiO~3 thin films on Si substrates

Lee, H.-Y. / Liang, K. S. / Lee, C.-H. / Wu, T.-B.

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Check availability in my library

Order at Subito €

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Document information

Title:

Real-time x-ray scattering study of growth behavior of sputter-deposited LaNiO~3 thin films on Si substrates

Contributors:

Lee, H.-Y. (author) / Liang, K. S. (author) / Lee, C.-H. (author) / Wu, T.-B. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 15 ; 2606-2611

Publication date:

2000-01-01

Size:

6 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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