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In situ microscopic surface characterization studies of polymeric thin films during tensile deformation using atomic force microscopy
In situ microscopic surface characterization studies of polymeric thin films during tensile deformation using atomic force microscopy
In situ microscopic surface characterization studies of polymeric thin films during tensile deformation using atomic force microscopy
Bobji, M. S. (Autor:in) / Bhushan, B. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 16 ; 844-855
01.01.2001
12 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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