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In situ microscopic surface characterization studies of polymeric thin films during tensile deformation using atomic force microscopy
In situ microscopic surface characterization studies of polymeric thin films during tensile deformation using atomic force microscopy
In situ microscopic surface characterization studies of polymeric thin films during tensile deformation using atomic force microscopy
Bobji, M. S. (author) / Bhushan, B. (author)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 16 ; 844-855
2001-01-01
12 pages
Article (Journal)
English
DDC:
620.11
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