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Annealing behavior of new micro-defects in < 100 > p-type large-diameter CZ-Si crystal
Annealing behavior of new micro-defects in < 100 > p-type large-diameter CZ-Si crystal
Annealing behavior of new micro-defects in < 100 > p-type large-diameter CZ-Si crystal
Bingyan, R. (Autor:in) / Caichi, L. (Autor:in) / Qiuyan, H. (Autor:in) / Zhicheng, Z. (Autor:in) / Haiyun, W. (Autor:in)
RARE METALS -BEIJING- ENGLISH EDITION ; 19 ; 275-278
01.01.2000
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
669
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