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Annealing behavior of new micro-defects in < 100 > p-type large-diameter CZ-Si crystal
Annealing behavior of new micro-defects in < 100 > p-type large-diameter CZ-Si crystal
Annealing behavior of new micro-defects in < 100 > p-type large-diameter CZ-Si crystal
Bingyan, R. (author) / Caichi, L. (author) / Qiuyan, H. (author) / Zhicheng, Z. (author) / Haiyun, W. (author)
RARE METALS -BEIJING- ENGLISH EDITION ; 19 ; 275-278
2000-01-01
4 pages
Article (Journal)
English
DDC:
669
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