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Real defect concentration measurements of nuclear detector materials by the combination of PICTS and SCLC methods
Real defect concentration measurements of nuclear detector materials by the combination of PICTS and SCLC methods
Real defect concentration measurements of nuclear detector materials by the combination of PICTS and SCLC methods
Ayoub, M. (Autor:in) / Hage-Ali, M. (Autor:in) / Koebel, J. M. (Autor:in) / Regal, R. (Autor:in) / Rit, C. (Autor:in) / Klotz, F. (Autor:in) / Zumbiehli, A. (Autor:in) / Siffert, P. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 83 ; 173 - 179
01.01.2001
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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