Contact-less electrical defect characterisation of silicon by MD-PICTS

Dornich, K. / Niemietz, K. / Wagner, M. et al. | British Library Online Contents | 2006

Defect specific topography of GaAs wafers by microwave-detected photo induced current transient spectroscopy

Grundig-Wendrock, B. / Jurisch, M. / Niklas, J. R. | British Library Online Contents | 2002

Real defect concentration measurements of nuclear detector materials by the combination of PICTS and SCLC methods

Ayoub, M. / Hage-Ali, M. / Koebel, J. M. et al. | British Library Online Contents | 2001

Investigation of Defects in 4H-SiC by Synchrotron Topography, Raman Spectroscopy Imaging and Photoluminescence Spectroscopy Imaging

Pernot, E. / El Harrouni, I. / Mermoux, M. et al. | British Library Online Contents | 2003

Photoluminescence Topography of Fluorescent SiC and its Corresponding Source Crystals

Wilhelm, M. / Kaiser, M. / Jakubavicius, V. et al. | British Library Online Contents | 2013