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Real defect concentration measurements of nuclear detector materials by the combination of PICTS and SCLC methods
Real defect concentration measurements of nuclear detector materials by the combination of PICTS and SCLC methods
Real defect concentration measurements of nuclear detector materials by the combination of PICTS and SCLC methods
Ayoub, M. (author) / Hage-Ali, M. (author) / Koebel, J. M. (author) / Regal, R. (author) / Rit, C. (author) / Klotz, F. (author) / Zumbiehli, A. (author) / Siffert, P. (author)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 83 ; 173 - 179
2001-01-01
7 pages
Article (Journal)
English
DDC:
620.11
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