Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Measurement of the thermal conductivity of thin layers using a scanning thermal microscope
Measurement of the thermal conductivity of thin layers using a scanning thermal microscope
Measurement of the thermal conductivity of thin layers using a scanning thermal microscope
Meinders, E. R. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 16 ; 2530-2543
01.01.2001
14 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Contactless Measurement of the Thermal Conductivity of Thin SiC Layers
| British Library Online Contents | 1998
Quantitative analysis of thin-film conductivity by scanning microwave microscope
| British Library Online Contents | 2007
Thermal Conductivity Measurement of Tungsten Oxide Nanoscale Thin Films
| British Library Online Contents | 2006
Characterizing Joule Heating in Polymer Light-Emitting Diodes Using a Scanning Thermal Microscope
| British Library Online Contents | 2004
Dynamic Friction Measurement with the Scanning Force Microscope
| Springer Verlag | 2001