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Trenches around and between self assembled silicon/germanium islands grown on silicon substrates investigated by atomic force microscopy

Denker, U. / Dashiell, M. W. / Jin-Phillipp, N. Y. / Schmidt, O. G.

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Trenches around and between self assembled silicon/germanium islands grown on silicon substrates investigated by atomic force microscopy

Denker, U. / Dashiell, M. W. / Jin-Phillipp, N. Y. / Schmidt, O. G.

Trenches around and between self assembled silicon/germanium islands grown on silicon substrates investigated by atomic force microscopy

Denker, U. / Dashiell, M. W. / Jin-Phillipp, N. Y. / Schmidt, O. G.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

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Ähnliche Titel

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Dokumentinformationen

Titel:

Trenches around and between self assembled silicon/germanium islands grown on silicon substrates investigated by atomic force microscopy

Beteiligte:

Denker, U. (Autor:in) / Dashiell, M. W. (Autor:in) / Jin-Phillipp, N. Y. (Autor:in) / Schmidt, O. G. (Autor:in)

Erschienen in:

MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 89 ; 166 - 170

Erscheinungsdatum:

01.01.2002

Format / Umfang:

5 pages

ISSN:

0921-5107

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

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