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Trenches around and between self assembled silicon/germanium islands grown on silicon substrates investigated by atomic force microscopy

Denker, U. / Dashiell, M. W. / Jin-Phillipp, N. Y. / Schmidt, O. G.

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Trenches around and between self assembled silicon/germanium islands grown on silicon substrates investigated by atomic force microscopy

Denker, U. / Dashiell, M. W. / Jin-Phillipp, N. Y. / Schmidt, O. G.

Trenches around and between self assembled silicon/germanium islands grown on silicon substrates investigated by atomic force microscopy

Denker, U. / Dashiell, M. W. / Jin-Phillipp, N. Y. / Schmidt, O. G.

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Check availability in my library

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Document information

Title:

Trenches around and between self assembled silicon/germanium islands grown on silicon substrates investigated by atomic force microscopy

Contributors:

Denker, U. (author) / Dashiell, M. W. (author) / Jin-Phillipp, N. Y. (author) / Schmidt, O. G. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 89 ; 166 - 170

Publication date:

2002-01-01

Size:

5 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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