Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
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Contactless characterization of surface and interface band-bending in Silicon-On-Insulator (SOI) structures
Contactless characterization of surface and interface band-bending in Silicon-On-Insulator (SOI) structures
Contactless characterization of surface and interface band-bending in Silicon-On-Insulator (SOI) structures
Okumura, T. (Autor:in) / En, A. (Autor:in) / Eguchi, K. (Autor:in) / Suhara, M. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 91-92 ; 182 - 185
01.01.2002
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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