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High-Voltage Pulse Instabilities in SiC Schottky Diodes with Implanted Resistive Edge Terminations
High-Voltage Pulse Instabilities in SiC Schottky Diodes with Implanted Resistive Edge Terminations
High-Voltage Pulse Instabilities in SiC Schottky Diodes with Implanted Resistive Edge Terminations
Morisette, D. T. (Autor:in) / Cooper, J. A. (Autor:in)
MATERIALS SCIENCE FORUM ; 389/393 ; 1157-1160
01.01.2002
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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