Structural Defects in Electrically Degraded 4H-SiC PiN Diodes

Persson, P. O. A. / Jacobson, H. / Molina-Aldareguia, J. M. et al. | British Library Online Contents | 2002

Ballistic electron emission microscopy of Schottky diodes on RF-plasma-treated silicon

Quattropani, L. / Solt, K. / Niedermann, P. et al. | British Library Online Contents | 1993

Ballistic electron emission microscopy of Schottky diodes on RF-plasma-treated silicon

Quattropani, L. / Solt, K. / Niedermann, P. et al. | British Library Online Contents | 1993

Coupling between the Raman Spectroscopy and Photoemission Microscopy Techniques: Investigation of Defects in Biased 4H-SiC pin Diodes

Thuaire, A. / Mermoux, M. / Bano, E. et al. | British Library Online Contents | 2007

Electrically active defects in SiC Schottky barrier diodes

Gelczuk, u. / DÄ…browska-szata, M. / Synowiec, Z. a. | British Library Online Contents | 2011