Nondestructive Analysis of Stacking Faults in 4H-SiC Bulk Wafers by Room-Temperature Photoluminescence Mapping under Deep UV Excitation

Hoshino, N. / Tajima, M. / Hayashi, T. et al. | British Library Online Contents | 2007

Characterization of SiC Wafers by Photoluminescence Mapping

Tajima, M. / Higashi, E. / Hayashi, T. et al. | British Library Online Contents | 2006

Comparison of high temperature annealed Czochralski silicon wafers and epitaxial wafers

Graef, D. / Lambert, U. / Brohl, M. et al. | British Library Online Contents | 1996

Carrier Generation Lifetime in 4H-SiC Epitaxial Wafers

Chung, G.Y. / Loboda, M.J. / Marninella, M.J. et al. | British Library Online Contents | 2009

Polarization-Resolved Imaging for Both Photoelastic and Photoluminescence Characterization of Photovoltaic Silicon Wafers

Lin, T. W. / Rowe, L. P. / Kaczkowski, A. J. et al. | British Library Online Contents | 2016