The elimination of the `artifact` in the electrostatic force measurement using a novel noncontact atomic force microscope/electrostatic force microscope

Okamoto, K. / Sugawara, Y. / Morita, S. | British Library Online Contents | 2002

Observation of Si(100) surface with noncontact atomic force microscope at 5K

Uozumi, T. / Tomiyoshi, Y. / Suehira, N. et al. | British Library Online Contents | 2002

The atomic resolution imaging of metallic Ag(111) surface by noncontact atomic force microscope

Orisaka, S. / Minobe, T. / Uchihashi, T. et al. | British Library Online Contents | 1999

Development of low temperature ultrahigh vacuum noncontact atomic force microscope with PZT cantilever

Suehira, N. / Tomiyoshi, Y. / Sugiyama, K. et al. | British Library Online Contents | 2000

Surface structure investigations using noncontact atomic force microscopy

Kolodziej, J. J. / Such, B. / Goryl, M. et al. | British Library Online Contents | 2006