Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Microstructural and analytical investigation of low temperature crystallized amorphous silicon/crystallized silicon interface using SEM and EDS
Microstructural and analytical investigation of low temperature crystallized amorphous silicon/crystallized silicon interface using SEM and EDS
Microstructural and analytical investigation of low temperature crystallized amorphous silicon/crystallized silicon interface using SEM and EDS
Kishore, R. (Autor:in) / Sood, K. N. (Autor:in) / Naseem, H. A. (Autor:in)
JOURNAL OF MATERIALS SCIENCE LETTERS ; 21 ; 647-648
01.01.2002
2 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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