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    Microstructural and analytical investigation of low temperature crystallized amorphous silicon/crystallized silicon interface using SEM and EDS

    New search for: Kishore, R.
    New search for: Sood, K. N.
    New search for: Naseem, H. A.

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    Microstructural and analytical investigation of low temperature crystallized amorphous silicon/crystallized silicon interface using SEM and EDS

    New search for: Kishore, R.
    New search for: Sood, K. N.
    New search for: Naseem, H. A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Microstructural and analytical investigation of low temperature crystallized amorphous silicon/crystallized silicon interface using SEM and EDS

    New search for: Kishore, R.
    New search for: Sood, K. N.
    New search for: Naseem, H. A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
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    Document information
    Title:

    Microstructural and analytical investigation of low temperature crystallized amorphous silicon/crystallized silicon interface using SEM and EDS

    Contributors:

    Kishore, R. (author) / Sood, K. N. (author) / Naseem, H. A. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE LETTERS ; 21 ; 647-648

    Publication date:

    2002-01-01

    Size:

    2 pages

    ISSN:

    0261-8028

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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