Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Methods for defect characterisation in thin film materials by depth-selective 2D-ACAR
Methods for defect characterisation in thin film materials by depth-selective 2D-ACAR
Methods for defect characterisation in thin film materials by depth-selective 2D-ACAR
Eijt, S. W. (Autor:in) / Falub, C. V. (Autor:in) / van Veen, A. (Autor:in) / Schut, H. (Autor:in) / Mijnarends, P. E. (Autor:in)
APPLIED SURFACE SCIENCE ; 194 ; 234-238
01.01.2002
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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