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    Methods for defect characterisation in thin film materials by depth-selective 2D-ACAR

    New search for: Eijt, S. W.
    New search for: Falub, C. V.
    New search for: van Veen, A.
    New search for: Schut, H.
    New search for: Mijnarends, P. E.

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    Methods for defect characterisation in thin film materials by depth-selective 2D-ACAR

    New search for: Eijt, S. W.
    New search for: Falub, C. V.
    New search for: van Veen, A.
    New search for: Schut, H.
    New search for: Mijnarends, P. E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Methods for defect characterisation in thin film materials by depth-selective 2D-ACAR

    New search for: Eijt, S. W.
    New search for: Falub, C. V.
    New search for: van Veen, A.
    New search for: Schut, H.
    New search for: Mijnarends, P. E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Methods for defect characterisation in thin film materials by depth-selective 2D-ACAR

    Contributors:

    Eijt, S. W. (author) / Falub, C. V. (author) / van Veen, A. (author) / Schut, H. (author) / Mijnarends, P. E. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 194 ; 234-238

    Publication date:

    2002-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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