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Functional degradation of NiZnCu-based multilayer chip inductors during nickel electroplating
Functional degradation of NiZnCu-based multilayer chip inductors during nickel electroplating
Functional degradation of NiZnCu-based multilayer chip inductors during nickel electroplating
Cao, J. L. (Autor:in) / Wang, X. H. (Autor:in) / Zhang, L. (Autor:in) / Li, L. T. (Autor:in)
MATERIALS LETTERS ; 57 ; 386-391
01.01.2002
6 pages
Aufsatz (Zeitschrift)
Englisch
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