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Doubly versus singly positively charged oxygen ions back-scattered from a silicon surface under dynamic O2+ bombardment
Doubly versus singly positively charged oxygen ions back-scattered from a silicon surface under dynamic O2+ bombardment
Doubly versus singly positively charged oxygen ions back-scattered from a silicon surface under dynamic O2+ bombardment
Franzreb, K. (Autor:in) / Williams, P. (Autor:in) / Lorincik, J. (Autor:in) / Sroubek, Z. (Autor:in)
APPLIED SURFACE SCIENCE ; 203-204 ; 39-42
01.01.2003
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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