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    Doubly versus singly positively charged oxygen ions back-scattered from a silicon surface under dynamic O2+ bombardment

    New search for: Franzreb, K.
    New search for: Williams, P.
    New search for: Lorincik, J.
    New search for: Sroubek, Z.

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    Doubly versus singly positively charged oxygen ions back-scattered from a silicon surface under dynamic O2+ bombardment

    New search for: Franzreb, K.
    New search for: Williams, P.
    New search for: Lorincik, J.
    New search for: Sroubek, Z.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Doubly versus singly positively charged oxygen ions back-scattered from a silicon surface under dynamic O2+ bombardment

    New search for: Franzreb, K.
    New search for: Williams, P.
    New search for: Lorincik, J.
    New search for: Sroubek, Z.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Doubly versus singly positively charged oxygen ions back-scattered from a silicon surface under dynamic O2+ bombardment

    Contributors:

    Franzreb, K. (author) / Williams, P. (author) / Lorincik, J. (author) / Sroubek, Z. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 203-204 ; 39-42

    Publication date:

    2003-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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