Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks
Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks
Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks
De Witte, H. (Autor:in) / Conard, T. (Autor:in) / Vandervorst, W. (Autor:in) / Gijbels, R. (Autor:in)
APPLIED SURFACE SCIENCE ; 203-204 ; 523-526
01.01.2003
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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