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Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation
Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation
Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation
Sadewasser, S. (Autor:in) / Glatzel, T. (Autor:in) / Shikler, R. (Autor:in) / Rosenwaks, Y. (Autor:in) / Lux-Steiner, M. C. (Autor:in)
APPLIED SURFACE SCIENCE ; 210 ; 32-36
01.01.2003
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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