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Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation
Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation
Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation
Sadewasser, S. (author) / Glatzel, T. (author) / Shikler, R. (author) / Rosenwaks, Y. (author) / Lux-Steiner, M. C. (author)
APPLIED SURFACE SCIENCE ; 210 ; 32-36
2003-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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