Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
From overall equipment efficiency (OEE) to overall Fab effectiveness (OFE)
From overall equipment efficiency (OEE) to overall Fab effectiveness (OFE)
From overall equipment efficiency (OEE) to overall Fab effectiveness (OFE)
Oechsner, R. (Autor:in) / Pfeffer, M. (Autor:in) / Pfitzner, L. (Autor:in) / Binder, H. (Autor:in) / Muller, E. (Autor:in) / Vonderstrass, T. (Autor:in)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 5 ; 333-339
01.01.2002
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.38152
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