Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Determination of recombination lifetime in MOS structures by a sine voltage-sweep technique
Determination of recombination lifetime in MOS structures by a sine voltage-sweep technique
Determination of recombination lifetime in MOS structures by a sine voltage-sweep technique
Peykov, P. (Autor:in) / Diaz, T. (Autor:in) / Aceves, M. (Autor:in)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 5 ; 515-518
01.01.2002
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.38152
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