Surface analysis for LiBq4 growing on ITO and CuPc film using atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS)

Gu-ping, O. / Wen-ming, G. / Shi-chao, J. et al. | British Library Online Contents | 2006

Dielectric anisotropy and electrical properties of the copper phthalocyanine (CuPc): 4-4'-n-Heptylcyanobiphenyl (7CB) composite liquid crystals

Al-Hazmi, F. / Al-Ghamdi, A.A. / Al-Senany, N. et al. | British Library Online Contents | 2014

Ultraviolet photoelectron spectroscopy investigation of interface formation in an indium-tin oxide/fluorocarbon/organic semiconductor contact

Tong, S. W. / Lau, K. M. / Sun, H. Y. et al. | British Library Online Contents | 2006

Surface and interface analysis of tris-(8-hydroxyquinoline) aluminum and indium-tin-oxide using atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS)

Zheng, D. / Li, H. / Wang, Y. et al. | British Library Online Contents | 2001

Study of indium tin oxide -4,4prime-bis(4-dimethylaminostyryl) benzene interface: an X ray photoelectron spectroscopy investigation

Nguyen, T. P. / Ip, J. | British Library Online Contents | 2002