Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Surface and interface analysis for copper phthalocyanine (CuPc) and indium-tin-oxide (ITO) using X-ray photoelectron spectroscopy (XPS)

    New search for: Zheng, D.
    New search for: Gao, Z.
    New search for: He, X.
    New search for: Zhang, F.
    New search for: Liu, L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Surface and interface analysis for copper phthalocyanine (CuPc) and indium-tin-oxide (ITO) using X-ray photoelectron spectroscopy (XPS)

    New search for: Zheng, D.
    New search for: Gao, Z.
    New search for: He, X.
    New search for: Zhang, F.
    New search for: Liu, L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Surface and interface analysis for copper phthalocyanine (CuPc) and indium-tin-oxide (ITO) using X-ray photoelectron spectroscopy (XPS)

    New search for: Zheng, D.
    New search for: Gao, Z.
    New search for: He, X.
    New search for: Zhang, F.
    New search for: Liu, L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Surface and interface analysis for copper phthalocyanine (CuPc) and indium-tin-oxide (ITO) using X-ray photoelectron spectroscopy (XPS)

    Contributors:

    Zheng, D. (author) / Gao, Z. (author) / He, X. (author) / Zhang, F. (author) / Liu, L. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 211 ; 24-30

    Publication date:

    2003-01-01

    Size:

    7 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Surface analysis for LiBq4 growing on ITO and CuPc film using atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS)

    Gu-ping, O. / Wen-ming, G. / Shi-chao, J. et al. | British Library Online Contents | 2006

    Dielectric anisotropy and electrical properties of the copper phthalocyanine (CuPc): 4-4'-n-Heptylcyanobiphenyl (7CB) composite liquid crystals

    Al-Hazmi, F. / Al-Ghamdi, A.A. / Al-Senany, N. et al. | British Library Online Contents | 2014

    Ultraviolet photoelectron spectroscopy investigation of interface formation in an indium-tin oxide/fluorocarbon/organic semiconductor contact

    Tong, S. W. / Lau, K. M. / Sun, H. Y. et al. | British Library Online Contents | 2006

    Surface and interface analysis of tris-(8-hydroxyquinoline) aluminum and indium-tin-oxide using atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS)

    Zheng, D. / Li, H. / Wang, Y. et al. | British Library Online Contents | 2001

    Study of indium tin oxide -4,4prime-bis(4-dimethylaminostyryl) benzene interface: an X ray photoelectron spectroscopy investigation

    Nguyen, T. P. / Ip, J. | British Library Online Contents | 2002

    Back to top