Surface and interface analysis for copper phthalocyanine (CuPc) and indium-tin-oxide (ITO) using X-ray photoelectron spectroscopy (XPS)

Zheng, D. / Gao, Z. / He, X. et al. | British Library Online Contents | 2003

Surface and interface state analysis of the TPD/Alq3 using X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM)

Li, H. / Zhang, F. / Liu, S. | British Library Online Contents | 2004

Atomic Force Microscopy and X-Ray Photoelectron Spectroscopy Study on the Passive Film for Type 316L Stainless Steel

Wang, X. Y. / Wu, Y. S. / Zhang, L. et al. | British Library Online Contents | 2001

Membrane surface modification and characterization by X-ray photoelectron spectroscopy, atomic force microscopy and contact angle measurements

Khayet, M. | British Library Online Contents | 2004

Characterization of conducting molecular films on silicon: Auger electron spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy and surface photovoltage

Komolov, A. / Schaumburg, K. / Moller, P.J. et al. | British Library Online Contents | 1999