High resolution electron microscopy study of nickel silicide - silicon interface grown by molecular beam epitaxy

Feng, Y. Z. / Wu, Z. Q. | British Library Online Contents | 1996

Characterization of ferroelectric ceramics using x-ray diffraction, transmission electron microscopy, and x-ray photoelectron spectroscopy

Kim, J.-N. / Shin, K.-S. / Park, B.-O. et al. | British Library Online Contents | 2003

Scanning tunneling microscopy of titanium silicide nanoislands

Goldfarb, I. / Grossman, S. / Cohen-Taguri, G. et al. | British Library Online Contents | 2004

Microstructural characterization of ordered nickel silicide structures grown on (111) nickel silicide films

Ho, H. L. / Bauer, C. L. / Mahajan, S. et al. | British Library Online Contents | 1996

Transmission electron microscopy observation of CMOS devices of titanium self-aligned silicide technology with nitrogen (N^+) implantation process

Jia, Y. M. / Lim, C. W. / Bourdillon, A. J. et al. | British Library Online Contents | 1999