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The role of flaw geometry in thin film delamination from two-dimensional interface flaws along free edges

Ambrico, J. M. / Begley, M. R.

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The role of flaw geometry in thin film delamination from two-dimensional interface flaws along free edges

Ambrico, J. M. / Begley, M. R.

The role of flaw geometry in thin film delamination from two-dimensional interface flaws along free edges

Ambrico, J. M. / Begley, M. R.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

The role of flaw geometry in thin film delamination from two-dimensional interface flaws along free edges

Contributors:

Ambrico, J. M. (author) / Begley, M. R. (author)

Published in:

ENGINEERING FRACTURE MECHANICS ; 70 ; 1721-1736

Publication date:

2003-01-01

Size:

16 pages

ISSN:

0013-7944

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.1 / 126

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