Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Auto-correlation function analysis of crystallization in amorphous SiGe thin films
Auto-correlation function analysis of crystallization in amorphous SiGe thin films
Auto-correlation function analysis of crystallization in amorphous SiGe thin films
Chiang, T. F. (Autor:in) / Wu, W. W. (Autor:in) / Cheng, S. L. (Autor:in) / Lin, H. H. (Autor:in) / Lee, S. W. (Autor:in) / Chen, L. J. (Autor:in)
APPLIED SURFACE SCIENCE ; 212-213 ; 339-343
01.01.2003
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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