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Low-energy ion-beam induced effects in Al(1 0 0) surface studied using Rutherford backscattering and channeling
Low-energy ion-beam induced effects in Al(1 0 0) surface studied using Rutherford backscattering and channeling
Low-energy ion-beam induced effects in Al(1 0 0) surface studied using Rutherford backscattering and channeling
Ramana, C. V. (Autor:in) / Choi, B. S. (Autor:in) / Smith, R. J. (Autor:in)
APPLIED SURFACE SCIENCE ; 214 ; 338-350
01.01.2003
13 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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