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Low-energy ion-beam induced effects in Al(1 0 0) surface studied using Rutherford backscattering and channeling
Low-energy ion-beam induced effects in Al(1 0 0) surface studied using Rutherford backscattering and channeling
Low-energy ion-beam induced effects in Al(1 0 0) surface studied using Rutherford backscattering and channeling
Ramana, C. V. (author) / Choi, B. S. (author) / Smith, R. J. (author)
APPLIED SURFACE SCIENCE ; 214 ; 338-350
2003-01-01
13 pages
Article (Journal)
English
DDC:
621.35
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